Details
Title
End-stopped wavelets for detecting low-level features
Author(s)
Bhattacharjee, S. ; Vandergheynst, P.
Published in
Wavelet Applications in Signal and Image Processing VII
Series
SPIE Proceedings, 3813
Pages
732-741
Conference
SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, Denver, CO, United States
Date
1999
Publisher
IEEE
Other identifier(s)
View record in Web of Science
Laboratories
LTS2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LTS2 - Signal Processing Laboratory 2
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2006-06-14