On Accuracy/Robustness/Complexity Trade-Offs in Face Verification
2005
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Details
Title
On Accuracy/Robustness/Complexity Trade-Offs in Face Verification
Author(s)
Sanderson, Conrad ; Cardinaux, Fabien ; Bengio, Samy
Published in
IEEE International Conference on Information Technology and Applications, ICITA
Volume
1
Pages
638-643
Conference
IEEE International Conference on Information Technology and Applications, ICITA
Date
2005
Keywords
Additional link
URL; Related documents
Laboratories
LIDIAP
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LIDIAP - L'IDIAP Laboratory
Scientific production and competences > Euler Center for Signal Processing
Conference Papers
Work produced at EPFL
Published
Scientific production and competences > Euler Center for Signal Processing
Conference Papers
Work produced at EPFL
Published
Record creation date
2006-03-10