000082150 001__ 82150
000082150 005__ 20190416220416.0
000082150 02470 $$2DAR$$a3434
000082150 02470 $$2ISI$$a000179968800047
000082150 037__ $$aCONF
000082150 245__ $$aUsing Dirichlet Free Form Deformation to Fit Deformable Models to Noisy 3-D Data
000082150 269__ $$a2002
000082150 260__ $$c2002
000082150 336__ $$aConference Papers
000082150 700__ $$0241826$$aIlic, S.$$g129257
000082150 700__ $$0240252$$aFua, P.$$g112366
000082150 7112_ $$aEuropean Conference on Computer Vision (ECCV)$$dCopenhagen, Denmark
000082150 8564_ $$s334102$$uhttps://infoscience.epfl.ch/record/82150/files/top.pdf$$yn/a$$zn/a
000082150 909C0 $$0252087$$pCVLAB$$xU10659
000082150 909CO $$ooai:infoscience.tind.io:82150$$pconf$$pIC$$qGLOBAL_SET
000082150 917Z8 $$x112366
000082150 937__ $$aCVLAB-CONF-2002-007
000082150 970__ $$aIlicF02/CVLAB
000082150 973__ $$aEPFL$$rNON-REVIEWED$$sPUBLISHED
000082150 980__ $$aCONF