Spectroscopic ellipsometry of RuO2 films prepared by metalorganic chemical vapor deposition
1995
Details
Title
Spectroscopic ellipsometry of RuO2 films prepared by metalorganic chemical vapor deposition
Author(s)
Hones, Peter ; Gerfin, Tobias ; Graetzel, Michael
Published in
Applied Physics Letters
Volume
67
Issue
21
Pages
3078-80
Date
1995
Other identifier(s)
View record in Web of Science
Laboratories
LPI
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > LPI - Laboratory of Photonics and Interfaces
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-02-21