Fault-Tolerant Logic Gates with Neuromorphic CMOS Circuits
2005
Details
Title
Fault-Tolerant Logic Gates with Neuromorphic CMOS Circuits
Author(s)
Joye, Neil ; Schmid, Alexandre ; Asai, Tetsuya ; Leblebici, Yusuf
Published in
Proceedings of the Ninth International Conference on Cognitive and Neural Systems (ICCNS '05)
Volume
II
Issue
29
Conference
Ninth International Conference on Cognitive and Neural Systems, Boston, Massachusetts, USA, May 18-21
Date
2005
Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-12-06