On the Fault-Tolerance of a Clustered Single-Electron Neural Network for Differential Enhancement
2005
Details
Title
On the Fault-Tolerance of a Clustered Single-Electron Neural Network for Differential Enhancement
Author(s)
Oya, Takahide ; Schmid, Alexandre ; Asai, Tetsuya ; Leblebici, Yusuf ; Amemiya, Yoshihito
Published in
IEICE Electronics Express
Volume
2
Issue
3
Pages
76-80
Date
2005
Other identifier(s)
DAR: 9037
View record in Web of Science
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Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2005-11-21