Robust Circuit and System Design Methodologies for Nanometer-Scale Devices and Single-Electron Transistors

• Published in: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 12, num. 11, p. 1156-1166
• Publication date: 2004

Reference

• LSM-ARTICLE-2005-002
• doi:10.1109/TVLSI.2004.836292
• View record in Web of Science

Record created on 2005-11-21, modified on 2017-05-10