Home > Robust Circuit and System Design Methodologies for Nanometer-Scale Devices and Single-Electron Transistors
 

Robust Circuit and System Design Methodologies for Nanometer-Scale Devices and Single-Electron Transistors

Schmid, Alexandre ; Leblebici, Yusuf

Published in:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 12, 11, 1156-1166
Year:
2004
DOI:
10.1109/TVLSI.2004.836292
Other identifiers:
View record in Web of Science
Laboratories:
LSM

Record appears in:
Scientific production and competences > STI - School of Engineering > IEL - Institute of Electrical Engineering > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2005-11-21, last modified 2018-03-17


Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)