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In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe
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In-Situ Ellipsometry and SHG Measurements of the G[...]
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Wark, A.
et al
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JEC_435_1997_173
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JEC_435_1997_173.pdf
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27 Jan 2018, 12:25
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