In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe

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In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe

Wark, A.; Berlouis, L. E. A.; Jackson, F.; Lochran, S.; Cruickshank, F. R.; Brevet, P. F.

1997

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Title In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe

Author(s) Wark, A. ; Berlouis, L. E. A. ; Jackson, F. ; Lochran, S. ; Cruickshank, F. R. ; Brevet, P. F.

Published in Journal of Electroanalytical Chemistry

Volume 435

Issue 1-2

Pages 173

Date 1997

DOI 10.1016/S0022-0728(97)00302-1

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Laboratories LEPA

Record Appears in Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > LEPA - Laboratory of Physical and Analytical Electrochemistry
Peer-reviewed publications
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