In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe

• Published in: J. Electroanal. Chem, vol. 435, num. 1-2, p. 173
• Publication date: 1997

Reference

• LEPA-ARTICLE-1997-003
• doi:10.1016/S0022-0728(97)00302-1
• View record in Web of Science

Record created on 2005-11-07, modified on 2017-05-12