Home > In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe
 

In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe

Wark, A. ; Berlouis, L. E. A. ; Jackson, F. ; Lochran, S.[...]

Published in:
J. Electroanal. Chem, 435, 1-2, 173
Year:
1997
DOI:
10.1016/S0022-0728(97)00302-1
Other identifiers:
View record in Web of Science
Laboratories:
LEPA

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > LEPA - Laboratory of Physical and Analytical Electrochemistry
Restricted access
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published

Note: The status of this file is: EPFL only


 Record created 2005-11-07, last modified 2018-03-17

n/a:
Download fulltext
PDF
Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)