In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe
1997
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Details
Title
In-Situ Ellipsometry and SHG Measurements of the Growth of CdS layers on CdxHg1-xTe
Author(s)
Wark, A. ; Berlouis, L. E. A. ; Jackson, F. ; Lochran, S. ; Cruickshank, F. R. ; Brevet, P. F.
Published in
Journal of Electroanalytical Chemistry
Volume
435
Issue
1-2
Pages
173
Date
1997
Other identifier(s)
View record in Web of Science
Laboratories
LEPA