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Surface-modification of SiO2 nozzle for patch-clamp measurements on-chip
Lehnert, T.
;
Laine, A.
;
Gijs, M.A.M.
2003
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Title
Surface-modification of SiO2 nozzle for patch-clamp measurements on-chip
Author(s)
Lehnert, T.
;
Laine, A.
;
Gijs, M.A.M.
Conference
Micro Total Analysis Systems 2003, Squaw Valley, CA, USA, October 5-9
Date
2003
Laboratories
LMIS2
Record Appears in
Scientific production and competences
>
STI - School of Engineering
>
IEM - Institut d'Electricité et de Microtechnique
>
LMIS2 - Microsystems Laboratory 2
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-10-26
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