Analysis of Reliability in Nano-Scale Circuits and Systems Based on A-Priori Statistical Fault-Modeling Methodology

This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete Monte Carlo based tool for a-priori functional fault tolerance analysis was developed, that induces different failure models, and does subsequent evaluation of system reliability under realistic constraints. A structured fault modeling architecture is also proposed, which is together with the tool a part of the new reliability design method representing a compatible improvement of existing IC design methodologies.


Published in:
48th Midwest Symposium on Circuits and Systems, 1565-1568
Presented at:
Midwest Symposium on Circuits and Systems (MWSCAS), 2005, Cincinnati, Ohio, USA, August 7-10
Year:
2005
Publisher:
IEEE
Keywords:
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 Record created 2005-10-25, last modified 2018-03-17

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