HIGH-RESOLUTION ELECTRON-BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
1991
Details
Title
HIGH-RESOLUTION ELECTRON-BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
Author(s)
ALVARADO, SF ; Renaud, Philippe ; MEIER, HP
Published in
JOURNAL DE PHYSIQUE IV
Volume
1
Issue
C6
Pages
271-275
Date
1991
Laboratories
LMIS4
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LMIS4 - Microsystems Laboratory 4
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Peer-reviewed publications
Work outside EPFL
Journal Articles
Published
Record creation date
2005-09-16