Fatigue Resistance of ITI Implant-Abutment Connectors and a comparison of the standard cone with a novel internally keyed design
2002
Details
Title
Fatigue Resistance of ITI Implant-Abutment Connectors and a comparison of the standard cone with a novel internally keyed design
Author(s)
Periard, J. ; Wiskott, H. W. A. ; Mellal, A. ; Scherrer, S. S. ; Botsis, J. ; Belser, U. C.
Published in
Clinical Oral Implants Research
Volume
13
Issue
5
Pages
542-549
Date
2002
Other identifier(s)
View record in Web of Science
DAR: 3523
DAR: 3523
Laboratories
LMAF
Record Appears in
Scientific production and competences > STI - School of Engineering > IGM - Institute of Mechanical Engineering > LMAF - Laboratory of Applied Mechanics and Reliability Analysis
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2005-09-14