High Resolution Backside Thermography using a Numerical Aperture Increasing Lens


Presented at:
29th International Symposium for Testing and Failure Analysis, Santa Clara, CA, 2-6 November 2003
Year:
2003
Note:
Proceedings of 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara, CA
Laboratories:




 Record created 2005-08-30, last modified 2018-03-17


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