Infoscience

Conference paper

High Resolution Backside Thermography using a Numerical Aperture Increasing Lens

    Note:

    Proceedings of 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara, CA

    Reference

    • LSM-CONF-2003-007

    Record created on 2005-08-30, modified on 2016-08-08

Fulltext

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