Robust and Fault-Tolerant Circuit Design for Nanometer-Scale Devices and Single-Electron Transistors
2004
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Details
Title
Robust and Fault-Tolerant Circuit Design for Nanometer-Scale Devices and Single-Electron Transistors
Author(s)
Schmid, A. ; Leblebici, Y.
Published in
2004 IEEE International Symposium on Circuits and Systems
Volume
3
Pages
685-688
Conference
2004 IEEE International Symposium on Circuits and Systems, Vancouver, BC, May 2004
Date
2004
Other identifier(s)
View record in Web of Science
Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-08-30