000053591 001__ 53591
000053591 005__ 20180317092415.0
000053591 02470 $$2ISI$$a000223102200172
000053591 037__ $$aCONF
000053591 245__ $$aRobust and Fault-Tolerant Circuit Design for Nanometer-Scale Devices and Single-Electron Transistors
000053591 269__ $$a2004
000053591 260__ $$c2004
000053591 336__ $$aConference Papers
000053591 500__ $$a2004 IEEE International Symposium on Circuits and Systems, Vancouver, BC, May 2004
000053591 700__ $$0241347$$aSchmid, A.$$g108571
000053591 700__ $$0240162$$aLeblebici, Y.$$g112194
000053591 7112_ $$a2004 IEEE International Symposium on Circuits and Systems$$cVancouver, BC$$dMay 2004
000053591 8564_ $$s487033$$uhttps://infoscience.epfl.ch/record/53591/files/iscas04n02.pdf$$zn/a
000053591 909CO $$ooai:infoscience.tind.io:53591$$pSTI$$pconf
000053591 909C0 $$0252051$$pLSM$$xU10325
000053591 937__ $$aLSM-CONF-2004-014
000053591 970__ $$apub.htm0016/LSM
000053591 973__ $$aEPFL$$sPUBLISHED
000053591 980__ $$aCONF