A highly fault tolerant PLA architecture for failure-prone nanometer CMOS and novel quantum device technologies
2004
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Details
Title
A highly fault tolerant PLA architecture for failure-prone nanometer CMOS and novel quantum device technologies
Author(s)
Schmid, A. ; Leblebici, Y.
Published in
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Pages
39-47
Conference
Failure-Prone Nanometer CMOS and Novel Quantum Device Technologies, 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT'04, Cannes, France, October 2004
Date
2004
Laboratories
LSM
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-08-30