On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations
2004
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Title
On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations
Author(s)
Worm, Frédéric ; Ienne, Paolo ; Thiran, Patrick ; De Micheli, Giovanni
Published in
IEEE Design and Test of Computers
Volume
21
Issue
6
Pages
524-35
Date
2004
Keywords
Other identifier(s)
DAR: 5953
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Record Appears in
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LSI1 - Integrated Systems Laboratory 1 (STI/IC)
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2005-08-08