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FNSIM: A Functional Fault Simulator for Efficient Testability Analysis

Ienne, Paolo

Published in:
Proceedings of the European Test Conference, 526-27
Year:
1993
Laboratories:
LAP

Record appears in:
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Conference Papers
Work produced at EPFL
Published



 Record created 2005-08-08, last modified 2018-03-17


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