FNSIM: A Functional Fault Simulator for Efficient Testability Analysis
Ienne, Paolo
1993

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Title FNSIM: A Functional Fault Simulator for Efficient Testability Analysis
Author(s) Ienne, Paolo
Published in Proceedings of the European Test Conference
Pages 526-27
Date 1993
Laboratories LAP
Record Appears in Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Conference Papers
Work produced at EPFL
Published

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