Details
Title
FNSIM: A Functional Fault Simulator for Efficient Testability Analysis
Author(s)
Ienne, Paolo
Published in
Proceedings of the European Test Conference
Pages
526-27
Date
1993
Laboratories
LAP
Record Appears in
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2005-08-08