Details
Title
FNSIM: A Functional Fault Simulator for Efficient Testability Analysis
Author(s)
Ienne, Paolo
Date
1992
Publisher
Lausanne, Switzerland
Laboratories
LAP
Record Appears in
Scientific production and competences > I&C - School of Computer and Communication Sciences > IINFCOM > LAP - Processor Architecture Laboratory
Work produced at EPFL
Technical Reports
Published
Work produced at EPFL
Technical Reports
Published
Record creation date
2005-08-08