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Title
Caracterization and reliability of thin dielectrics and MOSFETs
Author(s)
Okhonin, Serguei
Advisor(s)
Pagination
91
Date
2002
Publisher
Lausanne, EPFL
Language
English
Laboratories
LEG1
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LEG1 - Electronics Laboratory 1
Scientific production and competences > EPFL Theses
Work produced at EPFL
Published
Theses
Scientific production and competences > EPFL Theses
Work produced at EPFL
Published
Theses
Record creation date
2005-03-16