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Drift in silicon integrated sensors and circuits due to thermo-mechanical stresses
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Drift in silicon integrated sensors and circuits d[...]
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Manic, Dragan
- 2213
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EPFL_TH2213
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EPFL_TH2213.pdf
[9.59 MB]
27 Jan 2018, 13:45
Texte intégral / Full text
Texte intégral / Full text