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conference paper
Charge-based modeling of field effect transistors, Make it easy
January 1, 2021
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
In this presentation, we revisit some charge-voltage dependences for different architectures of field effect transistor, emphasizing on compactness and simplicity while maintaining a close link with physics, which makes these models predictive and accurate for general purposes of compact modeling.
Use this identifier to reference this record
Type
conference paper
Web of Science ID
WOS:000790181800030
Authors
Publication date
2021-01-01
Publisher
Published in
2021 Joint International Eurosoi Workshop And International Conference On Ultimate Integration On Silicon (Eurosoi-Ulis)
ISBN of the book
978-1-6654-3745-5
Publisher place
New York
Series title/Series vol.
International Conference on Ultimate Integration on Silicon
Peer reviewed
REVIEWED
EPFL units
Event name | Event place | Event date |
Caen, FRANCE | Sep 01-03, 2021 | |
Available on Infoscience
May 23, 2022