Hysteresis Dynamics in Double-Gated n-Type WSe2 FETs With High-k Top Gate Dielectric
2019
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Title
Hysteresis Dynamics in Double-Gated n-Type WSe2 FETs With High-k Top Gate Dielectric
Author(s)
Oliva, Nicolò ; Ilarionov, Yury Yu ; Casu, Emanuele Andrea ; Cavalieri, Matteo ; Knobloch, Theresia ; Grasser, Tibor ; Ionescu, Mihai Adrian
Published in
IEEE Journal of the Electron Devices Society
Volume
7
Pages
1163-1169
Date
2019-08-07
Laboratories
NANOLAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > NANOLAB - Nanoelectronic Devices Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2020-01-24