Thermo-refractive noise in silicon nitride microresonators
Huang, Guanhao; Lucas, Erwan; Liu, Junqiu; Raja, Arslan S.; Lihachev, Grigory; Gorodetsky, Michael L.; Engelsen, Nils J.; Kippenberg, Tobias J.
2019

Abstract

Thermodynamic noises limit the frequency stability of resonators. Here, we present the first complete characterization of thermo-refractive noise in Si3N4 microresonators. The measurements are in good agreement with theoretical analysis and FEM simulation of the structures. (c) 2019 The Author(s)

Details

Title Thermo-refractive noise in silicon nitride microresonators
Author(s) Huang, Guanhao ; Lucas, Erwan ; Liu, Junqiu ; Raja, Arslan S. ; Lihachev, Grigory ; Gorodetsky, Michael L. ; Engelsen, Nils J. ; Kippenberg, Tobias J.
Published in 2019 Conference On Lasers And Electro-Optics (Cleo)
Series Conference on Lasers and Electro-Optics
Conference Conference on Lasers and Electro-Optics (CLEO), May 05-10, 2019, San Jose, CA
Date 2019-01-01
Publisher New York, IEEE
ISSN 2160-9020
ISBN 978-1-943580-57-6
DOI https://doi.org/10.1364/CLEO_SI.2019.STh1H.3
Other identifier(s) View record in Web of Science
Laboratories LPQM
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LPQM - Laboratory of Photonics and Quantum Measurements (STI/SB)
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LPQM - Laboratory of Photonics and Quantum Measurements (STI/SB)
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date 2019-09-11

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