Huygens STED Deconvolution Increases Signal-to-Noise and Image Resolution towards 22 nm
2013
Files
Details
Title
Huygens STED Deconvolution Increases Signal-to-Noise and Image Resolution towards 22 nm
Author(s)
Schoonderwoert, Vincent ; Dijkstra, Remko ; Luckinavicius, Grazvydas ; Kobler, Oliver ; Van Der Voort, Hans
Published in
Microscopy Today
Volume
21
Issue
6
Pages
38-44
Date
2013
Publisher
Cambridge, Cambridge University Press
ISSN
1551-9295
2150-3583
2150-3583
Note
National Licences
Laboratories
ISIC
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > ISIC - Institute of Chemical Sciences and Engineering > UNATTRIBUTED-ISIC - ISIC - Unattributed publications
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23