Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
2012
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Title
Probing defects and impurity-induced electronic structure changes in single and double-layer hexagonal boron nitride sheets with STEM-EELS
Author(s)
Ramasse, Q. ; Alem, N. ; Zettl, A. ; Yazyev, O. ; Pan, C. ; Nair, R. ; Jalil, R. ; Zan, R. ; Bangert, U. ; Novoselov, K.S. ; Seabourne, C. ; Scott, A.J.
Published in
Microscopy and Microanalysis
Volume
18
Issue
S2
Pages
1526-1527
Date
2012
Publisher
Cambridge, Cambridge University Press
ISSN
1431-9276
1435-8115
1435-8115
Note
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Laboratories
C3MP
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > C3MP - Chair of computational condensed matter physics
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23