A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
1999
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Title
A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
Author(s)
Foeth, M. ; Sfera, A. ; Stadelmann, P. ; Buffat, P.-A.
Published in
Journal of Electron Microscopy
Volume
48
Issue
6
Pages
717-723
Date
1999
Publisher
Oxford, Oxford University Press
ISSN
0022-0744
1477-9986
1477-9986
Note
National Licences
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23