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A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls

Foeth, M. ; Sfera, A. ; Stadelmann, P. ; Buffat, P.-A.

Published in:
Microscopy, 48, 6, 717-723
Year:
1999
Publisher:
Oxford, Oxford University Press
ISSN:
0022-0744
1477-9986
Note:
National Licences
DOI:
10.1093/oxfordjournals.jmicro.a023740
Additional link:
Link to Swissbib
Laboratories:
CIME

Record appears in:
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published



 Record created 2019-08-23, last modified 2019-12-05

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