A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
Published in:
Microscopy, 48, 6, 717-723
Publisher:
Oxford, Oxford University Press
ISSN:
0022-0744
1477-9986
Additional link:
Laboratories:
Record created 2019-08-23, last modified 2019-12-05