A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls


Published in:
Microscopy, 48, 6, 717-723
Year:
1999
Publisher:
Oxford, Oxford University Press
ISSN:
0022-0744
1477-9986
Note:
National Licences
Additional link:
Laboratories:




 Record created 2019-08-23, last modified 2019-12-05

PUBLISHER'S VERSION:
Download fulltext
PDF

Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)