Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
2009
Files
Details
Title
Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration
Author(s)
Chang, L-Y ; Lazar, S ; Bártová, B ; Botton, Ga ; Hébert, C ; Fontcuberta i Morral, Anna
Published in
Microscopy and Microanalysis
Volume
15
Issue
S2
Pages
138-139
Date
2009
ISSN
1431-9276
1435-8115
1435-8115
Note
National Licences
Record Appears in
Scientific production and competences > STI - School of Engineering > IMX - Institute of Materials > LMSC - Laboratory of Semiconductor Materials
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23