3D EDX microanalysis by FIB-SEM: Elemental quantification enhancement
2012
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Details
Title
3D EDX microanalysis by FIB-SEM: Elemental quantification enhancement
Author(s)
Burdet, P. ; Cantoni, M. ; Hébert, C.
Published in
Microscopy and Microanalysis
Volume
18
Issue
S2
Pages
526-527
Date
2012
Publisher
Cambridge, Cambridge University Press
ISSN
1431-9276
1435-8115
1435-8115
Note
National Licences
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-08-23