Low-frequency Noise Characterization of Si Nanonet Field Effect Transistors
2019
Files
Details
Title
Low-frequency Noise Characterization of Si Nanonet Field Effect Transistors
Author(s)
Cazimajou, Thibauld ; Theodorou, Christoforos ; Legallais, Maxime ; Nguyen, Thi Thu Thuy ; Mouis, Mireille ; Ternon, Celine ; Salem, Bessem ; Ghibaudo, Gerard
Editor(s)
Conference
25th International Conference on Noise and Fluctuations (ICNF 2019), EPFL Neuchâtel campus - Neuchâtel, Switzerland, 18 - 21 June 2019
Date
2019
Publisher
ICLAB
Laboratories
ICLAB
Record Appears in
Scientific production and competences > EPFL Partners > Neuchâtel Campus > ICLAB - Integrated Circuits Laboratory
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Record creation date
2019-08-23