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conference paper not in proceedings
A 4-Terminal Method for Oxide and Semiconductor Trap Characterization in FDSOI MOSFETs
Han, Hung Chi
•
Theodorou, Christoforos
•
Ghibaudo, Gerard
2019
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Name
ICNF_2019_Full_Paper_60.pdf
Access type
openaccess
Size
731.44 KB
Format
Adobe PDF
Checksum (MD5)
4d2144cd2af6375307f2038242e9d0ac