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Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node
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Low frequency noise characterization and modeling [...]
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El Beyrouthy, Johnny
et al
Main
file(s):
ICNF_2019_Full_Paper_59
version 1
ICNF_2019_Full_Paper_59.pdf
[362.0 KB]
22 Aug 2019, 10:05