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Integrated W-Band Measurement System Combining IMD, S-Parameters and Noise Figure Suitable for Coax, Waveguide and On-Wafer Test
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Integrated W-Band Measurement System Combining IMD[...]
-
Dunsmore, Joel
et al
Main
file(s):
ICNF_2019_Full_Paper_57
version 1
ICNF_2019_Full_Paper_57.pdf
[398.74 KB]
22 Aug 2019, 10:03