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  4. Characterization of semiconductor nanocrystals using advanced NMR spectroscopy
 
conference paper

Characterization of semiconductor nanocrystals using advanced NMR spectroscopy

Piveteau, Laura
•
Ong, Ta-Chung
•
Walder, Brennan  
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March 31, 2019
Abstracts Of Papers Of The American Chemical Society
National Meeting of the American-Chemical-Society (ACS)
  • Details
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Type
conference paper
Web of Science ID

WOS:000478860504035

Author(s)
Piveteau, Laura
Ong, Ta-Chung
Walder, Brennan  
Dirin, Dmitry
Moscheni, Daniele
Schneider, Barbara
Protesescu, Loredana
Masciocchi, Norberto
Guagliardi, Antonietta
Emsley, Lyndon  
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Date Issued

2019-03-31

Publisher

AMER CHEMICAL SOC

Publisher place

Washington

Published in
Abstracts Of Papers Of The American Chemical Society
Volume

257

Subjects

Chemistry, Multidisciplinary

•

Chemistry

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LRM  
ISIC-GE  
Event nameEvent placeEvent date
National Meeting of the American-Chemical-Society (ACS)

Orlando, FL

Mar 31-Apr 04, 2019

Available on Infoscience
August 22, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/160065
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