1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm
2019
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Details
Title
1/f Noise in Fully Integrated Electrolytically Gated FinFETs with Fin Width Down to 20nm
Author(s)
Martens, Koen ; Du Bois, Bert ; Kong Siew, Yong ; Gupta, Anshul ; Veloso, Anabela ; Dupuy, Emmanuel ; Radisic, Dunja ; Altamirano Sanchez, Efrain ; Van Roy, Willem ; Severi, Simone ; Simoen, Eddy
Editor(s)
Conference
25th International Conference on Noise and Fluctuations (ICNF 2019), EPFL Neuchâtel campus - Neuchâtel, Switzerland, 18 - 21 June 2019
Date
2019
Publisher
ICLAB
Laboratories
ICLAB
Record Appears in
Scientific production and competences > EPFL Partners > Neuchâtel Campus > ICLAB - Integrated Circuits Laboratory
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Scientific production and competences > STI - School of Engineering > STI Archives > ICLAB - Integrated Circuits Laboratory
Peer-reviewed publications
Work outside EPFL
Conference Papers
Record creation date
2019-08-21