transmission electron-microscopy of cleavage wedges - application to gaaias/gaas system study
1988
Details
Title
transmission electron-microscopy of cleavage wedges - application to gaaias/gaas system study
Author(s)
RUTERANA, P ; GANIERE, JD ; Buffat, PA
Published in
Journal de microscopie et de spectroscopie électroniques
Volume
13
Issue
6
Pages
421-437
Date
1988
ISSN
0395-9279
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-07-04