Details
Title
low-temperature deformation in 200 kev electron-microscope
Author(s)
GOTTHARDT, R ; BUFFAT, P
Published in
Journal de microscopie et de spectroscopie électroniques
Volume
4
Issue
3
Pages
A24
Date
1979
ISSN
0395-9279
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-07-04