characterization of epitaxial layers by transmission electron-microscopy on wedge shaped samples
1990
Details
Title
characterization of epitaxial layers by transmission electron-microscopy on wedge shaped samples
Author(s)
Buffat, PA ; GANIERE, JD ; SPYCHER, R
Published in
vide-science technique et applications
Date
1990
ISSN
1266-0167
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2019-07-04