Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures
1989
Details
Title
Transmission and Reflection Electron Microscopy on Cleaved Edges of III-V Multilayered Structures
Author(s)
Buffat, Philippe-André ; Ganière, Jean-Daniel ; Stadelmann, Pierre
Published in
NATO ASI Series
Editor(s)
Volume
203
Pages
319-334
Conference
Evaluation of Advanced Semiconductor Materials by Electron Microscopy, Wills Hall, Bristol, UK, 11-17 September 1988
Date
1989
Publisher
NATO
ISBN
0-306-43362-1
Other identifier(s)
DOI: https://doi.org/10.1007/978-1-4613-0527-9_23
Laboratories
CIME
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > CIME - Interdisciplinary Center for Electron Microscopy
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Record creation date
2019-07-04