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  4. 3D-Stacked CMOS SPAD Image Sensors: Technology and Applications
 
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conference paper

3D-Stacked CMOS SPAD Image Sensors: Technology and Applications

Charbon, Edoardo  
•
Bruschini, Claudio  
•
Lee, Myung-Jae  
January 1, 2018
2018 25Th Ieee International Conference On Electronics, Circuits And Systems (Icecs)
25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

3Dstacked CMOS SPAD based image sensors hold the promise for better sensitivity and more functionality per pixel. The technology enables to separate detection from computation onto different chips, or tiers, that are stacked onto one another. One advantage is to be able to independently optimize detection and processing in dedicated processes. Another is to achieve extremely low skews across large chips, thus enabling accurate timing over multi-megapixel image sensors. A further advantage is the potential of implementing advanced functionality requiring large arrays of computational units directly connected with the detectors, thus paving the way to onchip convolutional neural networks and deep learning engines. In this paper we review several technologies enabling this interesting evolution and examples of possible implementations in the context of actual applications.

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Type
conference paper
DOI
10.1109/ICECS.2018.8617983
Web of Science ID

WOS:000458965100001

Author(s)
Charbon, Edoardo  
•
Bruschini, Claudio  
•
Lee, Myung-Jae  
Date Issued

2018-01-01

Publisher

IEEE

Publisher place

New York

Published in
2018 25Th Ieee International Conference On Electronics, Circuits And Systems (Icecs)
ISBN of the book

978-1-5386-9562-3

Series title/Series vol.

IEEE International Conference on Electronics Circuits and Systems

Start page

1

End page

4

Subjects

Engineering, Electrical & Electronic

•

Engineering

•

backside illumination

•

biomedical sensor

•

cmos

•

geiger-mode avalanche photodiode (g-apd)

•

image sensor

•

light detection and ranging (lidar)

•

optical sensor

•

photon counting

•

sensor

•

silicon

•

single-photon avalanche diode (spad)

•

single photon detector

•

single-photon imaging

•

single-photon sensor

•

three-dimensional integrated circuits

•

time-of-flight imaging

•

time to-digital converter (tdc)

Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
AQUA  
Event nameEvent placeEvent date
25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Bordeaux, FRANCE

Dec 09-12, 2018

Available on Infoscience
June 18, 2019
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/156946
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