Modeling Potential-Induced Degradation (PID) of Field-Exposed Crystalline Silicon Solar PV Modules: Focus on a Regeneration Term
2017
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Title
Modeling Potential-Induced Degradation (PID) of Field-Exposed Crystalline Silicon Solar PV Modules: Focus on a Regeneration Term
Published in
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
Pagination
5
Pages
2794-2798
Conference
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), Washington, D.C., USA, June 25-30, 2017
Date
2017
Publisher
IEEE
Laboratories
PV-LAB
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > PV-LAB - Photovoltaics and Thin Film Electronics Laboratory
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Scientific production and competences > EPFL Partners > Neuchâtel Campus > PV-Lab - Photovoltaics and Thin Film Electronics Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Record creation date
2019-02-22