Custom Adapter For Extended Field-Of-View Microsphere-Based Scanning Super-Resolution Microscopy

We present a dielectric microsphere-based super resolution optical microscope that can image a sample beyond the classical diffraction limit [1]. The super resolution imaging capability of a single microsphere normally is restricted to an area of similar to 10 mu m(2), which essentially is the area of close contact of the microsphere with the sample. By fixing the microsphere to a microscope objective via a glass-based template chip and a custom adapter, we perform automated step-by-step scanning and imaging of the sample. Later, the generated image set is stitched into a single wide-field super resolution image using a dedicated algorithm. Furthermore, we propose the parallel use of microspheres, thereby enabling faster scanning or bigger sample areas to be imaged.


Published in:
2018 Ieee Micro Electro Mechanical Systems (Mems), 700-703
Presented at:
31st IEEE International Conference on Micro Electro Mechanical Systems (MEMS), Belfast, NORTH IRELAND, Jan 21-25, 2018
Year:
Jan 01 2018
Publisher:
New York, IEEE
ISSN:
1084-6999
ISBN:
978-1-5386-4782-0
Keywords:




 Record created 2018-11-14, last modified 2019-08-12


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)