Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
2018
Details
Title
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography
Author(s)
Di Russo, E ; Moyon, F ; Gogneau, N ; Largeau, L ; Giraud, E ; Carlin, JF ; Grandjean, N ; Chauveau, JM ; Hugues, M ; Blum, I ; Lefebvre, W ; Vurpillot, F ; Blavette, D ; Rigutti, L
Published in
JOURNAL OF PHYSICAL CHEMISTRY C
Volume
122
Issue
29
Pages
16704-16714
Date
2018
Other identifier(s)
View record in Web of Science
Laboratories
LASPE
Record Appears in
Scientific production and competences > SB - School of Basic Sciences > IPHYS - Institute of Physics > LASPE - Laboratory of Advanced Semiconductors for Photonics and Electronics
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2018-11-08