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application/pdfIEEEIEEE Journal of the Electron Devices Society;2018;6; ;10.1109/JEDS.2018.2821763Cryogenic electronicsCMOScryogeniccryo-CMOScharacterizationmodelingkink4 KLNACharacterization and Compact Modeling of Nanometer CMOS Transistors at Deep-Cryogenic TemperaturesRosario M. IncandelaLin SongHarald HomulleEdoardo CharbonAndrei VladimirescuFabio Sebastiano
IEEE Journal of the Electron Devices Society996 2018610.1109/JEDS.2018.28217631006
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