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  4. Nanoscale thermal imaging of active devices by fluorescent SThM
 
conference paper

Nanoscale thermal imaging of active devices by fluorescent SThM

Lin, H.J.
•
Assy, A.
•
Lemaire, Etienne Pierre  
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December 25, 2017
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems
23rd International Workshop Thermal Investigations of ICs and Systems (Therminics)
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Type
conference paper
DOI
10.1109/THERMINIC.2017.8233839
Author(s)
Lin, H.J.
Assy, A.
Lemaire, Etienne Pierre  
Briand, Danick  
Billot, L.
Gredin, P.
Mortier, M.
Aigouy, L.
Date Issued

2017-12-25

Publisher

IEEE

Published in
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems
Total of pages

4 p.

Editorial or Peer reviewed

REVIEWED

Written at

EPFL

EPFL units
LMTS  
Event nameEvent placeEvent date
23rd International Workshop Thermal Investigations of ICs and Systems (Therminics)

Amsterdam, The Netherlands

September 26-29, 2017

Available on Infoscience
April 2, 2018
Use this identifier to reference this record
https://infoscience.epfl.ch/handle/20.500.14299/145862
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