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Nanoscale thermal imaging of active devices by fluorescent SThM

Lin, H.J. ; Assy, A. ; Lemaire, Etienne Pierre ; Briand, Danick ; Billot, L. ; Gredin, P. ; Mortier, M. ; Aigouy, L.

Published in:
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems, 4 p.
Presented at:
23rd International Workshop Thermal Investigations of ICs and Systems (Therminics) , Amsterdam, The Netherlands, September 26-29, 2017
Year:
Dec 25 2017
Publisher:
IEEE
DOI:
10.1109/THERMINIC.2017.8233839
Laboratories:
LMTS

Record appears in:
Scientific production and competences > STI - School of Engineering > IMT - Institute of Microengineering > LMTS - Microsystems for Space Technologies Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL



 Record created 2018-04-02, last modified 2020-04-20


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