Nanoscale thermal imaging of active devices by fluorescent SThM


Published in:
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems, 4 p.
Presented at:
23rd International Workshop Thermal Investigations of ICs and Systems (Therminics) , Amsterdam, The Netherlands, September 26-29, 2017
Year:
Dec 25 2017
Publisher:
IEEE
Laboratories:




 Record created 2018-04-02, last modified 2020-04-20


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