conference paper
Nanoscale thermal imaging of active devices by fluorescent SThM
December 25, 2017
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems
Type
conference paper
Author(s)
Date Issued
2017-12-25
Publisher
Published in
IEEE proceedings of the 23rd International Workshop Thermal Investigations of ICs and Systems
Total of pages
4 p.
Editorial or Peer reviewed
REVIEWED
Written at
EPFL
EPFL units
| Event name | Event place | Event date |
Amsterdam, The Netherlands | September 26-29, 2017 | |
Available on Infoscience
April 2, 2018
Use this identifier to reference this record