Details
Title
Pashchenko, Vladimir
Sciper ID
264054
Affiliated labs
LC
Publications
Abnormal Grain Growth in AlScN Thin Films Induced by Complexion Formation at Crystallite Interfaces
Determination of elastic and piezoelectric properties of Al0.84Sc0.16N thin films
Effective SAW excitation on non-piezoelectric substrate using AlScN piezoelectric thin film BAW/SAW hybrid transducer
Enhanced piezoelectric properties of c-axis textured aluminium scandium nitride thin films with high scandium content: influence of intrinsic str[...]
Ex-situ AlN seed layer for (0001)-textured Al0.84Sc0.16N thin films grown on SiO2 substrates
Free standing and solidly mounted Lamb wave resonators based on Al0.85Sc0.15N thin film
Hybrid BAW/SAW AlN and AlScN Thin Film Resonator First Experimental data
Material Constants Extraction For Alscn Thin Films Using A Dual Mode Baw Resonator
Material Parameter Extraction for Complex AlScN Thin Film Using Dual Mode Resonators in Combination with Advanced Microstructural Analysis and Fi[...]
Determination of elastic and piezoelectric properties of Al0.84Sc0.16N thin films
Effective SAW excitation on non-piezoelectric substrate using AlScN piezoelectric thin film BAW/SAW hybrid transducer
Enhanced piezoelectric properties of c-axis textured aluminium scandium nitride thin films with high scandium content: influence of intrinsic str[...]
Ex-situ AlN seed layer for (0001)-textured Al0.84Sc0.16N thin films grown on SiO2 substrates
Free standing and solidly mounted Lamb wave resonators based on Al0.85Sc0.15N thin film
Hybrid BAW/SAW AlN and AlScN Thin Film Resonator First Experimental data
Material Constants Extraction For Alscn Thin Films Using A Dual Mode Baw Resonator
Material Parameter Extraction for Complex AlScN Thin Film Using Dual Mode Resonators in Combination with Advanced Microstructural Analysis and Fi[...]
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