Details
Title
Aebersold, Arthur Brian
Sciper ID
178255
Affiliated labs
CIME
Publications
Height-resolved quantification of microstructure and texture in polycrystalline thin films using TEM orientation mapping
Investigation of polycrystalline ZnO film growth by quantitative TEM orientation mapping
Triplet grain growth in a-texture polycrystalline ZnO thin films
c-texture versus a-texture low pressure metalorganic chemical vapor deposition ZnO films: Lower resistivity despite smaller grain size
Investigation of polycrystalline ZnO film growth by quantitative TEM orientation mapping
Triplet grain growth in a-texture polycrystalline ZnO thin films
c-texture versus a-texture low pressure metalorganic chemical vapor deposition ZnO films: Lower resistivity despite smaller grain size
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Aebersold, A. Brian
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