Notice détaillée
Titre
Gautsch, Sebastian
Sciper ID
190049
Laboratoires affiliés
IEM
Publications
Complex nanostructures in PMMA made by a single process step using e-beam lithography
Development of an Atomic Force Microscope and Measurement Concepts for Characterizing Marian Dust and Soil Particles.
Fabrication of Heterogeneous Nanogaps for Characterizing Electrochemical Metal Deposition Processes
Microcolumn with variable axis lens for large scan fields and pixel numbers
NEMS Based Tools for Nanoscience and Atomic Clocks
Optimization of piezoresistive cantilever sensors towards highly sensitive membrane-type surface stress sensor (MSS) and its applications
Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
Remote Nanoimaging on Mars - Results of the Atomic Force Microscope onboard NASA’s Phoenix mission
Self Aligned Concentric Nanostructures Formed by E-beam Overexposure of PMMA and Single Post Processing Steps
Self Aligned Concentric Nanostructures Formed by E-beam Overexposure of PMMA and Single Post Processing Steps
Voir toutes les publications (63)
Development of an Atomic Force Microscope and Measurement Concepts for Characterizing Marian Dust and Soil Particles.
Fabrication of Heterogeneous Nanogaps for Characterizing Electrochemical Metal Deposition Processes
Microcolumn with variable axis lens for large scan fields and pixel numbers
NEMS Based Tools for Nanoscience and Atomic Clocks
Optimization of piezoresistive cantilever sensors towards highly sensitive membrane-type surface stress sensor (MSS) and its applications
Remote Nanoimaging on Mars - Results of the Atomic Force Microscope Onboard NASA's Phoenix Mission
Remote Nanoimaging on Mars - Results of the Atomic Force Microscope onboard NASA’s Phoenix mission
Self Aligned Concentric Nanostructures Formed by E-beam Overexposure of PMMA and Single Post Processing Steps
Self Aligned Concentric Nanostructures Formed by E-beam Overexposure of PMMA and Single Post Processing Steps
Voir toutes les publications (63)
Employé pour
Gautsch, S.
GAUTSCH, Sébastian
GAUTSCH, Sébastian
Toutes les ressources
Toutes les ressources
Le document apparaît dans
Authorities > People