Details
Title
Meyer, Vincent
Sciper ID
131636
Publications
Integration and modeling of ferroelectric devices in a standard CMOS porcess for low power non-volatile memories
Modeling the polarization in ferroelectric materials: A novel analytical approach
Tungsten based electrodes for stacked capacitor ferroelectric memories
Where are the missing gene defects in inherited retinal disorders? Intronic and synonymous variants contribute at least to 4% of CACNA1F-mediated[...]
Modeling the polarization in ferroelectric materials: A novel analytical approach
Tungsten based electrodes for stacked capacitor ferroelectric memories
Where are the missing gene defects in inherited retinal disorders? Intronic and synonymous variants contribute at least to 4% of CACNA1F-mediated[...]
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Meyer, V.
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